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Kaputt: A Large-Scale Dataset for Visual Defect Detection

Authors

Sebastian Höfer, Dorian F. Henning, Artemij Amiranashvili, Douglas Morrison, Mariliza Tzes, Ingmar Posner, Marc Matvienko, Alessandro Rennola, Anton Milan

ICCV-2025direct anomaly

Score

13

Tags

defect detection

Datasets

MVTecMVTec-ADVisA

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